Minutes of the Annual Meeting of
the TAG/ISO/TC172 — Optics and optical instruments
January 23, 2006, San Jose, California
at the Fairmont Hotel, Belvedere Room

Attendees: (9) Representing: Absent Leaders (6)

Walter Czajkowski
Olympus America, Inc.

TAG Chairperson, APOMA
Sid Braginsky Chair ISO/TC172
Admin: Gene Kohlenberg OEOSC
SC1: William Royall (by phone) Eastman Kodak Company

Leader SC1, COM Harvey Pollicove (deceased)

David Aikens Zygo Corporation
SC3: Gordon Boultbee, OCLI (Convener ISO/TC 172/SC 3/ WG 2)

Leader SC3, CREOL Kathleen Richardson
Leader SC4, Leupold & Stevens, Inc Fritz Kaufman.

Chung Cheng Leupold & Stevens, Inc.
Leader SC5, Nikon, Inc. Lee Schuett
Leader SC6, NIST Charles Fronczek
SC7: Charles Campbell Leader SC7
SC9: Robert Faaland (by phone) Leader SC9, FDA

Lincoln Endelman SPIE/Endelman Enterprises
General TAG:

  1. Welcome and Introductions
W. Czajkowski opened the meeting at 0838 H. Welcomed everyone.
  1. Adoption of Agenda
G. Boultbee moved that the draft agenda be adopted; C. Campbell seconded the motion. The motion carried.
  1. Approval of Minutes of January 25, 2005 TAG Meeting
G. Boultbee moved that the corrected draft minutes of the previous Annual Meeting be approved; D. Aikens seconded the motion, which carried.
  1. Report of OEOSC
D. Aikens stated that the Board met the previous day; OEOSC is solvent; there will be an increase in net funds for 2006 and funds should be stable for 2007. Marla Dowell was elected Chairperson Elect to replace Rick Nasca, who resigned.
  1. Report on ANSI/OP Status, D. Aikens
D. Aikens; surface imperfections and wavefront standards. Looking forward to two new standards being released in the next two years. Steve VanKerkhove from Corning Tropel is Leader of the wavefront task force. They are going through a finding phase to secure additional experts to support the project. It is D. Aikens plan to have those same experts assist with Tag efforts in the wavefront area, too. The imperfection standards task force is continuing to function under G. Boultbee's guidance. ANSI/OEOSC OP1.002, “American National Standard for Optics and Electro-Optical Instruments – Optical Elements and Assemblies –Appearance Imperfections” has been approved and will be released in 2006. The task force will now add an objective version to the standard in addition to the visual specification.
C. Campbell reported that Z80.28-2004 is a standard on wavefront standard. There is work in SC 7/WG for reporting the aberrations of the eye. It is essentially a wavefront standard, and has a different method of reporting the wavefront. D. Aikens asked the secretary to purchase a copy of this standard for the committee to review. C. Campbell is working on this aberration standard. I uses Zernike polynomials to represent the wavefront. He has found that there are a number of ways to describe the Zernike polynomials. The Ophthalmics industry places 0° to the right rather than up and 90° is up. The cartographers place 0° up and 90° to the right. They found that earlier descriptions of Zernike polynomials used the mapping or astronomical coordinate system.
W. Czajkowski asked D. Aikens to report changes in OEOSC Board. M. Dowell Chairperson Elect.
  1. Review of TC172 Work by Subcommittee
The printed report is available. D. Aikens and G. Kohlenberg represented the US at the meeting in Weimar, Germany in June. Working groups 1, 2 and 4 met. A committee document was submitted for a new version of ISO WD 10110-7, “Optics and photonics – Preparation of drawings for optical elements and systems – Part 7: Surface imperfection tolerances.” WI 10110-5 "Preparation of drawings … – Surface form tolerances" and A WI 10110-14 " Preparation of drawings … – Wavefront deformation tolerances" were also up for review. The metrology was removed from them and inserted into ISO/DIS 14999-4, “Optics and photonics Interferometric measurement of optical elements and optical systems Part 4: Application to the evaluation of tolerances specified in ISO 10110.” However ISO/DIS 14999-4 was rejected, so 10110-5 and -14 were stranded. A new version has been drafted.
The US was not happy with the development of the ISO/DIS 14999 series, so ASC OP decided to draft a US standard that combines the specification and metrology into one document.
The written report is available. WG 1 four standards confirmed; 2 work item proposals WG 2 ISO 9211-4 was revised and should be published any day now. Additional tests were added along with a normative annex on how to prepare a cheese cloth abrasion pad; 9211-3 needed revision because it referred to the -4 document. The other two parts of ISO 9211 were confirmed.
G. Boultbee said that he received an October dated letter in January that indicated AFNOR has resigned as the secretariat of SC 3. Any other organization that was interested in assuming the position as secretariat was to contact TC 172 by December 31, 2005. He wondered if anything had been said at the meeting in Weimar, Germany. No one heard anything. G. Boultbee said that there had been no meetings of the group in some time; there had been some e-mail communication.
G. Kohlenberg reported that ISO/TC 172/SC 1/WG 4 is looking for additional support. The US representative had been Mike Hayford from ORA. However, his work load has increased so that he is no longer able to participate.
C. Cheng represented him. The written report is available. Nine international standards were published with two more pending. SC 4 will have a meeting with SC 7 on a night vision device in April in Baden, SW. C. Campbell was curious which part of SC 7 would be included in the meeting. C. Cheng said that the invitation was not specific. C. Campbell mused that perhaps the meetings would be separate and the groups would co-mingle only during the social time.
The written report is available. L. Shuett had a business meeting in San Francisco, so he could not stay for this meeting. He apologized for not being able to attend.
C. Fronczek was not able to attend, but did submit a written report.
The report is available. A year in which a large number of documents were handled. There was no SC meeting, but contact lens and intraocular WGs did meet. Subcommittee meeting will be held in Baden, SW, where all working groups will meet. AFNOR is giving up the secretariat of spectacle lenses.
SC 9 — Electro-Optical Systems (and Lasers), R. Faaland, FDA
R. Faaland’s report is available. He summarized the activities. SC 9 will meet in Boulder, CO, in June.
  1. Old Business
  1. ISO/TC 172/SC 1 and SC 9 meeting in Boulder, CO, June 26 − 29, 2006
W. Czajkowski commented that these meetings will be hosted by NIST. M. Dowell will be busy getting ready for that activity.
  1. Selection of TAG/SC 1 Leader (to replace H. Pollicove)
D. Aikens volunteered to be SC 1 Leader since he has been able to relinquish the ASC OP Chairperson position.
  1. "margin-top: 0.17in; margin-bottom: 0in; page-break-after: avoid"> New Business
Selection of TAG Chairperson.
D. Aikens moved that Sid Braginsky, formerly with Olympus America, be elected the new TAG Chairperson, C. Campbell seconded the motion, which carried unanimously. Sid had been the secretary of ISO/TC 172 for two terms. G. Kohlenberg said that Sid's nomination came too late for him to make arrangements to attend this meeting.
  1. Objectives of TAG for 2006
D. Aikens is very disappointed in participation in SC 1; feels that other SCs are well handled. In SC 1 there is no active participation. Proposes that SC 1 be overhauled during the next 18 months so that there is a group of experts who are able to actively contribute to the work of the SC. C. Campbell described how SC 7 handles experts. The experts for the TAG are selected out of the Z80 membership. An additional requirement is that the person has attended Z80 meetings. The only time that an exception is made is when a special area of expertise is required and no one in that area has attended the Z80 meetings.
D. Aikens asked how experts for the June meeting would be chosen. G. Kohlenberg said that he has to submit a list of approved delegates to ISO through ANSI for each international meeting. Normally SC 1 has just D. Aikens and G. Kohlenberg on the list. W. Czajkowski is also included when he can attend. D. Aikens asked about walk-ins. G. Kohlenberg replied that no one should attend ISO meetings unless they are on the authorized list. Sometimes a person can be listed as an observer, but that person cannot actively participate.
C. Campbell said that SC 7 occasionally has problems with walk-ins when meetings are held in the US. If something will be discussed that is of commercial interest to a US company, sometimes a marketing person will show up and try to make a lot of noise. SC 7 does allow observers, but they demand that the observers be quiet and just listen. Z80 meets before an international meeting and looks at their potential list of authorized delegates and selects the ones who are able to attend.
D. Aikens thinks that the main problem with SC 1 is that there is little activity between meetings.
D. Aikens asked the secretary when the SC 1 agenda for the June meeting would be available. The secretary replied that it would be a month to six weeks, probably, before the agenda would be distributed. Then D. Aikens asked the secretary to provide him with a list of WG Leaders so that he can solicit a list of documents that will be addressed during the Boulder meetings. He would use the agenda items to help decide whom to solicit to attend the meeting.
G. Boultbee suggested that is in no better shape than SC 1. There is little activity in SC 3. He is the US expert for WG 2 (coatings). He does not consider himself an expert for WG 1 (optical glass); he occasionally gets a response from Kathleen Richardson. On some occasions W. Royall has provided feedback as a courtesy, even though he is not an official member of SC 3. G. Boultbee appreciated the help. There is very little activity in WG 1 internationally except for Schott Glass in Germany. In contrast he sees that there is a lot of activity in SC 1. He could understand D. Aiken's concern.
C. Campbell noted that there needs to be coordination between the SCs when there are issues that affect them both. An example discussed at this meeting is wavefront standards. There has also been quite a bit of activity concerning scratches on ophthalmic optics. There may be some similarities between the SC 7 scratch issues and SC 1 scratch issues.
L. Endelman asked how D. Aikens would select the participants. D. Aikens said that he would follow SC 7's lead and ask experts to participate in ASC OP first. International delegates will be selected from the ASC OP participant list. A US representative needs to have read standards and prepared position statements before becoming involved internationally.
G. Boultbee asked what financial cost would occur if we were to accept the SC 3 secretariat. The cost at the beginning of 2006 was $7,350.
D. Aikens reported that OEOSC is now offering a training course for scratch and dig. He asked if another SC may have opportunities for outreach and education. L. Endelman said that SPIE tried to do such and had little participation at a course explaining how ISO works (about 10 years ago). D. Aikens surmised that there may be interest in a course explaining the use of the coating standard. C. Campbell noted that he on occasionally gives talks, but he knows of no courses on SC 7 standards.
W. Royall suggested that the students at the scratch and dig class be asked about what other courses would be of interest. D. Aikens asked G. Boultbee to do that at the course being taught at this Photonics West conference.
  1. Time and Place for Next TAG Meeting
D. Aikens moved that the next TAG annual meeting be held in San Jose in January 2007 on at 8:30 a.m. G. Boultbee seconded motion, which carried unanimously.
  1. Adjournment
Since no other business came before the committee, D. Aikens moved that the meeting be adjourned; L. Endelman seconded; the motion carried. The meeting was adjourned at 0953 H.


Draft Minutes TAG TC 172 Annual Meeting 1-23-06.odt